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Integrated Alignment and Inspection Platform for High Precision Optical Continuous Images

並列摘要


This platform is mainly intended to be used as a facility for high precision optical continuous images. Then, with a fixed pattern being selected, this platform can quickly search, with resistance to variation, the mark that corresponds to the pattern in order to achieve the alignment and inspection target. Since the pattern is a minute component with multiple shapes and unstable features, this platform can automatically acquire it through the system or select it by user. The targets searched by the mark include light, intensity, occlusion and rotation. It then, calculates the variances of light, intensity, occlusion and rotation individually with the mark under detection, search and pattern to achieve the inspection function. Therefore, combined with a quick and accurate mark detection and the search method, this platform builds an interface integrated platform that is easy to operate and user-friendly.

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