Under the process variation, the yield of the chips which are at the different locations with different characterization is in the same wafer. Because of the characterization of the yield of the process variation, it is the easiest observation from the viewpoint of the wafer-map. In this paper, we suggest a wafer map generator with the special correlation which is based on the characterization of the bat-wing yield. The wafer map generator can produce the cluster phenomenon, and the rapid method has been established to judge the position and size of the cluster.