本研究嘗試建立一以最佳壽期成本 (Life-Cycle-Cost, LCC)之設備採購策略模式,目的是提供一透過成本有效性改善之共同目標整合供應商與製造商能力於低壽命週期成本之設備購置,其主要組成項目包括:資本、保養、操作、維修與轉賣。本研究整合失效模式與效應分析 (Failure Modes and Effects Analysis, FMEA)技術與設備保養成本分析,用以建構設備壽期成本最佳化決策而能維持並提高公司競爭力。FMEA是各產業應用最廣泛之故障要因解析手法,幾乎都在設計階段中將它用來檢討問題,找出產品、設備潛在故障原因,求得預先的改善對策。一修改式FMEA表將被用來收集資料並展現估計之設備失效成本、效應嚴重度與改善措施成本的相關性,以建立設備失效模式與成本效應分析的主要架構。本研究之主要貢獻將是嘗試為建構一個適合企業使用之設備失效模式與成本效應分析於壽期成本決策模式應用。最後,以某半導體產業個案之設備群來進行分析探討以及驗證可行性與實用性並提供業界參考。
This research attempts to establish an optimum life cycle cost (LCC) based equipment purchasing and maintenance model. The purpose is to provide a methodology for “integrating supplier and manufacturer capabilities through a common goal – “cost-effective improvement” based on lowering the LCC of purchased equipment consisting mainly of the following elements: invested capital, maintenance, operation, repair and salvage. This study integrates the failure mode effect analysis (FMEA) and equipment maintenance cost analysis methods to optimize the LCC of equipment decisions to sustain and promote the firms’ competitive capability. FMEA is a technique that emphasizes preventive rather than detection, discovering possible failure cause before product finalization, equipment design and manufacturing. A revised FMEA table will be utilized to collect data and demonstrate the relevance among estimated failure cost, severity of effect and cost of actions-taken that constructs the main frame of the proposed method, “equipment failure mode and cost-effect analysis”. The major contribution of this study will be a LCC decision model application appropriate for enterprises failure mode and cost-effect analysis utilization. This study uses an equipment group at a Semiconductor assembly house as a case study to prove the model’s applicability and suitability.