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以X光螢光光譜與X光繞射分析解析黴菌對紙張之影響

Illustration the Properties of Mildew-Damaged Paper by X-ray Fluorescence Spectroscopy and X-ray Diffraction Analysis

Abstracts


本研究探討三種於紙質文物常見的黴菌Aspergillus niger、Aspergillus terreus與 Chaetomium globosum對道林紙的危害,利用X光螢光光譜(XRF)分析黴害紙張表面元素的變化,以及X光繞射分析(XRD)分析黴害紙張的結晶度變化。研究結果顯示,由X光螢光光譜結果發現道林紙表面磷與硫的元素含量,隨著黴菌生長時間而增加,均有明顯升高的趨勢。黴害紙張的結晶度變化由X光粉末繞射分析,確認三種黴菌均會造成紙張的結晶度降低,以A. niger對纖維素結晶區的降解最為顯著。

Parallel abstracts


The damages by three mildews namely Aspergillus niger, Aspergillus terreus, and Chaetomium globosum, commonly found in mildew-caused paper deterioration, on the properties of wood-free paper were investigated in this study. X-ray fluorescence spectroscopy and X-ray diffraction analysis were employed to examine the changes of element and crystallinity of paper after the mildew test. The X-ray fluorescence analysis showed that the contents of phosphorus and sulfur of wood-free printed paper significantly increased with the period of the mildew test. Results from X-ray diffraction analysis also confirmed that all three mildews degraded the crystallinity of paper. A. niger caused the greatest damage on the cellulose crystalline region of paper after the mildew test.

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