- 期刊
高加速壽命試驗（HALT）及高加速應力篩選（HASS）測試規格制訂方法
An Approach on Developing Test Specification for Highly Accelerated Life Testing (HALT) and Highly Accelerated Stress Screening (HASS)
摘要
高加速壽命試驗（highly accelerated life testing, HALT）已證實可快速激發電子硬品潛在疵病或弱處，配合分析評估及擇優改進作業，將降低後續測試或使用之失效機率，為提升硬品品質之有效工具。惟實際運用上，品質工程師往往無法精準地掌握其測試手法及測試目標，對於如何運用HALT所獲得之品質數據，制訂高加速應力篩選（highly accelerated stress screening, HASS）規格，更是無所適從。本文係以硬品任務需求為導向，開發一套HALT測試手法及測試目標制定邏輯，以獲取硬品耐環境能力極值（包括操作極限及破壞極限）。同時演繹一套運用HALT所獲得之品質數據，制定HASS規格之流程，包括HASS有效性、安全性確認流程，以及篩選調整流程，並介紹數種證實有效之HASS輪廓，同時藉由案例研析，說明如何運用HALT測試結果，制訂HASS規格，期作為品質工程師導入HALT／HASS測試技術之參考運用。
並列摘要
Highly accelerated life testing (HALT) is proven to stimulate quickly latent defects or weaknesses in the electronic products. HALT is an effective tool for improving the quality of the products. When the analysis-evaluation-improvement operation is conducted continuously, it will reduce the probability of failure in subsequent tests or use. However, the quality engineers are often unable to accurately grasp the test methods and test objectives in practical applications. They are also confused to use correctly the quality data obtained by HALT or develop highly accelerated stress screening (HASS) specification. This paper presents a HALT test logic with the product's mission oriented to obtain the extreme of the hardware's environmental resistance. It will develop a set of procedures for establishing the HASS profile, proof of HASS, safety of HASS and screen tuning as well. Several HASS profiles proven effective also are introduced. Furthermore, a case study is applied, in which the HASS specification for using the quality data obtained by HALT is formulated. It is expected to be an approach for quality engineers joining with the promotion of HALT/HASS test technology.