Investigating a Hypothetical Semiconductor Laser Bar Using a Laser Diode Simulation/Emulation Tool Using Random Levels of Defects

C. K. Amuzuvi ； J. C. Attachie

《Research Journal of Applied Sciences, Engineering and Technology》 7卷6期 (2014/02) Pp. 1145-1148

並列摘要

In this study, Barlase, a semiconductor laser diode emulation tool, is used to emulate the by-emitter degradation of high power semiconductor laser diodes. ＂Barlase＂ is a software that uses a LabView control interface. We have demonstrated how ＂Barlase＂ works using a hypothetical laser diode bar (multiple emitters) to validate the usefulness of the tool. A scenario using the hypothetical bar was investigated to demonstrate ＂Barlase＂ as follows: random low-level of defects distributed across the bar. The results of the simulation show the successful implementation of ＂Barlase＂ in the by-emitter analysis of laser diodes.

並列關鍵字

Band gap energy ； by-emitter ； defect ； degradation ； emitter ； nonradiative recombination ； quantum well ； slope efficiency ； temperature ； threshold current