- 期刊
微電腦控制之自動化流動注入式氧化剝除電位分析法及其數據處理
Computerized Flow Injection Potentiometric Stripping Analysis and Its Data Processing
摘要
利用IBM相容性個人電腦A/D、D/A界面卡，並結合蠕動泵浦、樣品注入閥、定電位器和薄層流動式電話學偵測槽等，自行建立組裝一套微電腦控制之自動化流動注入式氧化剝除電位分析系統(FIA-PSA)。而實驗中測得支援使實驗數據，經由等區間化電位偵測法、積分還原及Savitzky-Golay一次微分等三步驟之數據處理過程後，除可有效地大幅降低雜訊，並使背景校正容易進行外，並可得到波狀峰的信號，在樣品流速為1 mL/min，沈積電位為-1.2V，沈積時間為120秒，氧化劑(溶氧)流速為0.5 mL/min，及取點頻率為25 KHz等實驗條件下，測定溶液中微量鉛、鎘之偵測極限皆可測至0.2 ppb，而分析速度則可達15樣品/小時。
並列摘要
A microcomputer-controlled automated flow injection potentiometric stripping analysis (FIA-PSA) system was constructed by use of an IBM-compatible personal computer and AID. D/A cards interfaced to peristaltic pumps. pneumatic-actuated sample injection valve. potentiostat and thin-layer flow cell. Via three consecutive data processing methods of multichannel potentiometric monitoring. integration and then Savitzky-Golay first-derivative data processing. the primary data were readily converted into peak-shaped signals which were not only better in signal-to -noise (SIN) ratios but also accessible to background correction. The method detection limit of 0.2 ppb each for determination of Pb and Cd can be achieved under the following experimental conditions: sample flow rate. 1.0 mL/min; deposition potential. -1.2 V; deposition time. 120 sec; oxidant (dissolved O_2) flow rate. 0.50 mL/min; sampling frequency. 25 KHz.