- 期刊
同步輻射光電子能譜與其顯微術在有機分子元件中的應用
Applications of Photoemission Spectroscopy and Related Microscopy in the Heterostructures of Organic Electronics
摘要
國家同步輻射研究中心提供多條軟X光(60-1200 eV)光束線，並發展相關軟X-光能譜術與顯微術。其中，光電子能譜術(PES)可以直接探測有機分子元件中分子薄膜與金屬基材介面間之電子結構和化學鍵結等訊息；而掃瞄式光電子顯微術(SPEM)實驗站則是藉由X光聚焦元件的引入，進而在量測光電子能譜之際同時建立該能譜與介面二維空間位置的關連性。結合第三代同步輻射光源的高亮度、可調變光子能量、以及可調變光偏振性(圓/線/橢圓偏振)等特性，光電子能譜與顯微術實驗站已成為探討有機分子薄膜與金屬基材接觸時其介面之化學組成與電子結構等課題之有力工具。
並列摘要
National Synchrotron Radiation Research Center (NSRRC) provides various soft x-ray beamlines and end stations for advanced spectroscopy and microscopy researches. To study the electronic structure and chemical bonding of interface between an organic-inorganic hybrid structures, the photoelectron spectroscopy (PES) is the tool of choice due to its great sensitivity toward the electronic environment. To further correlate the photoelectron spectra with the locations where electrons are emitted from, the scanning photoelectron microscopy (SPEM) station equipped with an x-ray focusing element (Fresnel zone plate) provided the needed capability. Incorporating with the third generation synchrotron facility that offers high brightness, continuous spectrum, and polarized photon, synchrotron based PES and SPEM have become powerful tools in investigating the chemical composition and electronic structure for organic-inorganic hybrid structures.