並列摘要
X-ray coherent diffraction imaging is a rapidly advancing X-ray microscopy technique of the past decade. In contrast to conventional X-ray microscopy, the foremost advantage of coherent scattering imaging lies in its spatial imaging resolution not being constrained by the quality of X-ray optical components. Its resolution can generally surpass 10 nanometers. Furthermore, X-ray coherent scattering imaging has the capability to integrate mature X-ray experimental techniques, such as X-ray absorption spectroscopy or X-ray single crystal diffraction. This integration can generate high-resolution images that retain the information from these existing techniques, such as element mappings on samples or strain analyzing in crystals.