在薄層化與高層數的積層陶瓷電容器(multilayer ceramic capacitors,MLCC)的開發過程中,因薄帶薄層化導致生胚層裂,造成產品良率不佳的問題。因此,本研究透過調整黏結劑添加比例,探討其對於生胚層裂的影響,並經由超音波掃描、MLCC 電性,以及高加速壽命等確認品質,藉此達到改善MLCC 產品品質。結果顯示:隨著所添加的黏結劑的比例增加,生胚層裂的數量將逐漸下降,但是黏結劑的添加量也不宜過多,太多的黏結劑對產品會產生負面影響,例如:疊層時的剝離能力下降、黏結劑燒除能力不佳、出現內部裂開與破壞電壓不良等問題。較佳的條件為:將黏結劑比例由原本的8,000 g/30,000 g BaTiO_3 powder 添加量,提高至9,500 g/30,000 g BaTiO_3 powder 時,可明顯改善生胚層裂問題,且產品良率由原本的77.1%,大幅提升至94.3%。
To reduce the thickness of ultrathin dielectric layer caused the crack of green compact, resulting in the poor yield of product for developing multi-layer ceramic capacitor (MLCC). Hence, the purpose of this study is to reduce the crack of green compact by adjusting the addition of binder. Moreover, the Binder Burn Out process is checked, as well as the quality and yield of MLCC product is measured by examining scanning acoustic, capacitance, dissipation factor, insulation resistance, breakdown voltage, and highly accelerated life test. The results show that the crack of compact in MLCC can be improved when adding more binders into the BaTiO3 powders. However, if too much binders were added, the poor quality of MLCC was found due to the less stacking peeling, the crack of product, and lower breakdown voltage. The addition amount of binders was increasing from 8,000 to 9,500 g/30,000 g BaTiO_3 powder, the better quality of MLCC was achieved, as well as the product yield increased significantly from 77.10% to 94.30%.