[2]Dickson J, “On-chip high-voltage generation in NMOS integrated circuits using an improved voltage multiplier technique,” IEEE Journal of Solid-State Circuits, vol. 11, no. 6, pp. 374-378, May 1976.
[5]M.D. Ker, S.L. Chen and S.C. Tsai, “Design of Charge Pump Circuit with Consideration of Gate-Oxide Reliability in Low-Voltage CMOS Process,” IEEE Journal of Solid-State Circuits, vol. 41, no. 5, pp. 1100-1107, May 2006.
[6]Yi-Hsin Weng, Hui-Wen Tsai, and Ming-Dou Ker, "Design to suppress return-back leakage current of charge pump circuit in low-voltage CMOS process," Microelectronics Reliability, vol. 51, no. 5, pp. 871-878, 2011.
[7]C.-H. Wu and C.-L. Chen, “A low-ripple charge pump with continuous pumping current control,” in Proc. 51st Midwest Symposium on Circuits and Systems, pp. 722–725, 2008.