- 學位論文
基於GIP液晶面板電路設計的Cell檢測方法
A Cell Testing Method on GIP LCD Circuit Design
摘要
在本篇論文中，我們提出了一個基於GIP液晶面板電路設計的Cell 檢測基法。主要的目的是在Cell階段，有效的利用訊號設定檢測出面板 缺陷，可以快速縮短反應製程之時間，有效增加生產品質。 本論文中，我們會介紹如何去設計GIP電路的檢測訊號。首先我們會利用訊號產生器設計GIP電路的訊號，我們使用二級GIP電路去設計GIP訊號。其次Shorting Bar和 GIP這兩種測試訊號方法的比較，以顯示這兩種方法的不同之處。然後根據驗證結果證明，由GIP電路設計的設置信號可以有效地檢測出面板缺陷。 本篇論文中，針對GIP LCD電路設計所提出的GIP電路設計信號檢測準確率核實後為94.83％
並列摘要
In this thesis, we propose a Cell testing method on GIP LCD circuit design. It will effectively edit clock signals to detect panel defects in cell stage, quickly shorten the reaction time of the process and effectively increase the production quality. In this thesis, we will propose the method of how to design GIP circuit detection signal. First, we use signal generator to design signals for GIP circuit design. The GIP circuit design we used two levels GIP circuit to design signal. Second, the comparison of the two methods: shorting bar testing signal and GIP testing signals will be made to show the differences of these two methods. Then, according to the verification results, it indicates that the setting signals by GIP circuit design can effectively detect panel defects. In this thesis, The signal detection accuracy rate of the proposed GIP circuit design signal to GIP LCD circuit design is 94.83% after verification