低同調干涉儀(Low Coherence Interferometer;LCI)是以麥克森干涉儀為基礎的技術,具備非侵入式、高解析度和高靈敏度的特性。當LCI的光源進入樣品時,由於樣品介質的不同,在樣品中的光路徑長度也會不一樣,且光程差小於光源同調長度時即產生干涉。 在本論文中,我們提出了一個改良的共路徑頻域光學同調斷層掃描系統架構,可以獲得兩組相位移的正交極化光,利用相位移演算法消除不必要的訊號達到兩倍的量測範圍,並且改良光路上的設計,使我們可以量測出未知樣品的厚度。換句話說,我們提出改良共路徑頻域光學同調斷層掃描可以一次性且全域的量測光學樣品的厚度。
Low Coherence Interferometer (LCI) is based on a Michelson interferometer technology, with characteristics of a non-invasive, high-resolution and high sensitivity. When the light into the sample LCI, the different samples of medium in the optical path length of the sample also different, and the optical path length difference is less than the coherence length of light , the interference pattern will happen. In this study, we propose an improved Common-path FD-OCT structure that can obtain the two phase-shifting signals from two orthogonally polarized lights. By phase-shifting algorithms over orthogonally polarized light, eliminating those unnecessary noise terms and doubling the measurement range. By designing the optical path, we can measure the thickness of unknown sample by FD-OCT. In other words, this improve structure of Common-path FD-OCT achieve measurement thick of optical samples based on full-range and one-shot measure.