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  • 學位論文

太陽能瑕疵檢測與複合光源應用

Defect Inspection of Silicon Solar Cells By Multiple Beam Source

指導教授 : 馬哲申

摘要


太陽能產業是世界各國共同持續發展的目標與趨勢,而太陽能模組品質好壞與耐用度,在電池片生產過程中瑕疵檢測就扮演著一個非常重要的關鍵因素,太陽能組件失效原因可能來自於在太陽能電池片製造階段的外觀不良,而外觀瑕疵檢測也就變成太陽能電池片製造商在出貨品質把關時候的一個非常重要的課題,因此,對於太陽能模組的品質以及可靠度,電池片的外觀瑕疵檢驗就顯得相當重要。 近年來國內外已有許多檢測機廠商投入開發許多檢測速度快且兼具高檢出率的專利自動光學檢測(Automatic Optical Inspection AOI) [1~5],這些機台也已被廣泛的發展使用中,這些檢測機照明光源設備主要使用LED的紅光作為瑕疵檢驗的主要取像光源,紅光光源架構系統可有效檢出約 90% 太陽能電池片外觀瑕疵種類同時達到低誤判率的穩定檢測,但在太陽能組件的電池片外觀品質條件要求不斷提高,想要在提升有效檢出率以現有紅光光源架構下很難達到同時達到高檢出率與低過判率並滿足客戶端模組外觀條件需求。 有鑑於此,本論文的研究方向為太陽能電池瑕疵檢測複合光源應用,利用單晶矽電池片表面顏色特性,欲檢測之項目為兩種污染類型瑕疵 (指印、刮傷、淡沾膠) (殘酸、藍斑),針對(指印、刮傷、淡沾膠) 類型瑕疵以演算法模擬強化光強化方式,達到提高(瑕疵與電池片背景)灰階對比差並有效突顯瑕疵灰階的特徵值,再研究測試新藍光光源檢測方式,以彌補改善紅光無法檢出的缺陷瑕疵(殘酸、藍斑), 實驗結果顯示,透過演算法模擬強化紅光方式可提高檢出率 30% (指印、刮傷、淡沾膠),新藍光瑕疵偵測系統功能可提高改善檢出率可達約 75% (殘酸、藍斑),兩套檢驗方式結果均可實際運用其產線生產。

並列摘要


The solar industry developement is the common goal and tendency of every country through out the world. To improve the quality and durability of solar module, defects inspection plays a very important role in it , while the failure of module may attribute to the abnormal appearance that occurs during the cell production. Spontaneuously, the inspection is no doubt a critical issue for the solar cell manufacturers in the quality control and pre-shipment inspection . Therefore, for solar module quality and reliability, the appearance defect inspection is quite important In recent years, many domestic and foreign testing machine manufacturers have invested in the development of many detection speed and both high detection rate of automatic automatic optical inspection (Automatic Optical Inspection AOI) [1 ~ 3], these machines have also been widely developed , The detection of these light source equipment, the main use of LED red light as a major inspection of the flaw detection of light source, red light source system can be effectively detected about 90% of the appearance of solar cell defects at the same time to achieve low false positive rate of stability testing, But in the solar components of the battery chip appearance quality requirements continue to improve, want to improve the effective detection rate to the existing red light source architecture is difficult to achieve at the same time to achieve high detection rate and low rate of judgment and to meet the client module appearance Conditional requirements In view of this, the research direction of this paper is the application of solar cell flaw detection composite light source, the use of single-crystal silicon chip surface color characteristics, to be tested for the two types of pollution defects (fingerprint, scratch, Acid, blue spot), for (fingerprints, scratches, light sticky) type of defects to the algorithm to simulate the enhanced light enhancement mode, to improve (flaws and battery background) gray-scale contrast difference and effectively highlight the flattery grayscale eigenvalues (Residual acid, blue spot), the experimental results show that the algorithm to simulate the multiples of the enhanced pull gray scale contrast method can improve the detection rate of 30 to improve the detection rate of the new blue light source to improve the detection of red light can not detect defects % (Fingerprint, scratch, light sticky glue), the new Blu-ray flaw detection system can improve the detection rate of up to about 75% (residual acid, blue spot), the two sets of test results can actually use its production line produce

參考文獻


附錄 參考文獻
[1]. ICOS Vision System PVI-6, The Complete High-Speed Inspection System, KLA-Tencor website (http://www.kla-tencor.com/MEMS-Wafer-Inspection/icos-wi-2x00.html) 。
[2]. VITRONIC Vision System , VITRONIC website (https://www.vitronic.com/industrial-
and-logistics-automation/applications/inspection-and-quality-checking/photovoltaic-inspection/vinspec-solar/solar-cell-inspection.html) 。
[3]. Chroma Automatic Optical Solar Cell/Wafer Inspection System Model 7200 series

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