This research focuses on the metallization layer of ceramic substrates which can be separated into high temperature direct bond copper and low temperature active bond copper substrates then microstructure, phase, mechanical properties and fracture surface analysis. On high temperature bond copper DBC substrates, Cu/Al2O3 can be combined at above 1000°C and analysis four-layer structure which included Cu, CuO, CuAl2O and Al2O3 phases. Broken at the boundary metal layer and under the final conditions , the strength can reach more than 3.03MPa. In low temperature direct bond copper DBC substrates, ultrasonic-Aided waves and additional A and X elements can effectively improve the bonding strength. In addition, X elements can be formed a boundary metal layer with Al2O3 substrates which break here.