光學應變規之研製

The Research and Development of Optical Strain Gage

謝宏榮(Hung-Jung Shei) ； 李恒慶(Heng-Ching Lee)

《中華技術學院學報》 34期 (2006/06) Pp. 161-172

https://doi.org/10.7095/JCIT.200606.0161

摘要

本研究主要是以單狹縫繞射理論結合雷射架構形成光學應變規量測系統，建立一套非破壞量測物體變形的方法。由於其系統架設容易，不僅不會如傳統應變規般使待測試件產生局部區域材料增強效應，而且不需要使用昂貴的設備即可達成，因此將可提供作為研究材料應變分析的另一種利器，除此之外，此種光學應變規量測系統在高溫環境操作上亦相當適合，可作為監視晶片封裝過程所產生的變形。

關鍵字

繞射 ； 雷射 ； 光學應變規

並列摘要

This research mainly combined the single slot diffraction theory with the Laser system to establish a measuring system of optical strain gage. In this system, a non-destructive testing method for measuring deformation was established. Because it is easy to set up, not only can avoid the material to occur local hardnees by traditional strain gage, but also don't need to use the expensive equipment and can immediately reach, so will provide another powerful tool to analyze strain. In additional, it is also suitable for high-temperature operating environment. For example it can monitor warping causes by hot stress during COB process.

並列關鍵字

diffraction ； Laser ； optical strain gage