電險及紅外光譜應用於塗布紙塗層結構分析

Analysis on the Coating Layer of Coated Paper by EM and FTIR

王秀華(Hsiu-Hwa Wang) ； 林曉洪(Sheau-Horng Lin)

《林產工業》 17卷3期 (1998/09) Pp. 537-550

摘要

藉掃描式電顯技術，以及能量分散式X射線分析法觀察塗布紙塗布層之微細結構，分析顏料和其他塗料成分之配比關係，比較各塗層之元素分佈，更進一步由傅立葉紅外光譜儀經散反射分析技術所得波數位置檢核各重要官能基之存否而與X射線之特性能量座標相互印證，以深入了解各種產品之塗布層特性，及其對塗布紙光學及印刷性質之影響。國產60磅單銅之白度較同基重之進口品優異許多，而不透明度、平滑度及粗糙度，則位列中數。塗布層元素種類和組成與進口紙者十分相當。進口紙雖白度、平滑度不及國產者，然具相當高之粗糙度而展現較低吸油度，因此印刷後光澤度更佳而使油墨乾燥時間延長許多。顏料顆粒之大小相差太大輒使平滑度表現不佳，若顏料僅使用白土，則紙品無法展現較佳之白度和不透明度，然若白土之寬厚比恰當則可獲得甚至優於雷射噴墨紙之平滑度。以SEM-EDX和FTIR兩種分析技術探討塗布紙之塗層化學性質，相互印證所獲結果，而可充分地解釋實測紙品塗布層物理性質之相關關係。

關鍵字

掃描式電顯技術 ； 能量分散式X射線分析 ； 傅立葉轉換紅外光譜 ； 塗布紙 ； 塗布層 ； 紙張性質

並列摘要

Scanning electron microscopy and energy dispersive X-ray analysis were introduced to examine the ultrafine structure of the coating layers of five specimens. Interrelationship among pigments and other additives in the coating colors was also investigated besides elemental distribution in each coating layer. Diffusion reflectance technique was coupled with Fourier tranform infrared spectroscopy to determine the existence of essential functional groups such that the results derived from EDX analysis could be double checked. The effect of coating layer components on the optical and printing properties of each coated specimen might thus be appreciated. Sixty pound locally made Clrsingle side coated paper) showed much better brightness than imported ones of the same basis weight; while opacity; smoothness and coarseness were all averagely ranked among the five tested specimens. Imported specimen with similar pigment elements and compositions displayedlower oil absorbancy and resulted in much better printed gloss and longer drying time of the wet ink. These could be attributed to its high coarseness. Once high aspect ratio of the pigment could be procured; a very high smoothness would be ensured. SEM-EDX and FTIR analyses have been proved to be very useful and reliable in the identifcation of the chemical properties of various coating layers. The results could logically be introduced to interpret the laboratory measured physical properties of the tested specimens.

並列關鍵字

SEM technique ； EDX analysis ； Fourier transform infrared spectrum ； Coated paper ； Coating layer ； Paper properties