透過您的圖書館登入
IP:18.224.44.108
  • 期刊

真空濺鍍及大氣電漿噴塗製程於SUS441表面鍍覆MnCo_2O_4保護層之微結構及電性比較

Effects of Coating Process on the Microstructural and Electrical Properties of MnCo_2O_4 Protective Film Coated SUS441 by Using Pulsed-DC Magnetron Sputtering and Atmospheric Plasma Spraying

摘要


本研究以SUS441不銹鋼為基板,做為高溫固態氧化物燃料電池(Solid oxide fuel cells, SOFCs)金屬連接板,表面分別以脈衝直流磁控濺鍍(Pulsed-DC Magnetron Sputtering, PDCMS)及大氣電漿噴塗(Atmospheric Plasma Spraying, APS)方式鍍覆MnCo_2O_4錳鈷氧化物做為保護膜,鍍膜厚度分別為5.0±0.5μm、60±20μm,以電子顯微鏡分析觀察保護膜組成及微結構,並於800°C空氣下熱處理5600小時,比較鍍膜試樣之高溫面積比電阻。研究結果顯示,兩種製程製備之保護膜只要達到一定的厚度,在5600小時測試範圍內,皆可滿足SOFC操作條件下之抗氧化需求,惟因APS製程之特性,初鍍膜之裂隙較大及孔洞較多,熱處理過程中出現短暫之元素分布差異,待熱處理時間增加,MnCo_2O_4膜層變為緻密且結構趨於穩定之晶相生成,其電性與PDCMS製程之試片接近。

並列摘要


We investigated the microstructural and electrical properties of MnCo_2O_4 protective film coated SUS441, which is employed as metallic interconnect in solid oxide fuel cell (SOFC) stack, after aging at 800 °C for 5600 hours in air. The thickness of MnCo_2O_4 films deposited on the surface of SUS441 were 5.0 ± 0.5 μm and 60 ± 20 μm by using Pulsed-DC magnetron sputtering technique (PDCMS) and atmospheric plasma spraying method (APS), respectively. Our results show that both of the protective layers prepared by the different processes meet anti-oxidation requirements after aging at elevated temperatures for 5600 hours. The as-sprayed film possesses a lot of cracks and holes due to the characteristics of the APS process. However, the MnCo_2O_4 film becomes dense and stable after a long-term heat treatment. Therefore, it shows a similar ASR values to the MnCo_2O_4 film which deposited by PDCMS technique.

參考文獻


P. Sathish, E.-K. Ahmad and S.-W. Robeert, J. Colloid Interface Sci., (2020), 579, 82-95.
M. Bednarz, S. Molin, M. Bobruk, M. Stygar, E. Dlugon, M. Sitarz and T. Brylewski, Mater. Chem. Phys., (2019), 225, 227-238.
F. Cheng and J. Sun, Int. J. Hydrog. Energy, (2019), 44, 18415-18424.
T. Brylewski, S. Molin, M. Marczynski, Ł. Mazur, K. Domaradzki, O. Kryshtal and A. Gil, Int. J. Hydrog. Energy, (2021), 46, 6775-6791.
Z.G. Yang, G.G. Xia and J.W. Stevenson, Electrochem. Solid-State Lett., (2005), 8(3), A168-A170.

延伸閱讀