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Flicker (1/f) Noise in 45^± Bi-Epitaxial Grain Boundary Junctions and dc SQUID of YBa2Cu3Oy

並列摘要


We have fabricated dc superconducting quantum interference devices (SQUIDs) incorporating 45℃ bi-epitaxial grain boundary junction, i.e. YBCO/YSZ and YBCO/YBCO/YSZ, in washer geometry. The 1/f noise power of single junction comes from resistance fluctuation for high current bias and critical current fluctuation for low current bias. The noise spectrum of the dc SQUIDs was measured with dc and ac bias schemes and showed value of ~ 1X10^-5 Φ 0/Hz^1/2 at 100 Hz. The possible noise sources, critical current fluctuations, flux motion noise and resistance fluctuation, are investigated. The results are compared with previous published data.

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Ho, C. C. (2016). 台北都會區大氣細懸浮微粒成份與來源之空間變異性模式分析 [doctoral dissertation, National Taiwan University]. Airiti Library. https://doi.org/10.6342/NTU201603855
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