自動化辨識並檢測奈米碳管背光模組之光圈缺陷位置及嚴重度

Automatic Detection and Measurement of Light Ring Defects on the Carbon Nanotube Backlight Units

莊文傑(Wen-Chieh Chuang) ； 李曉婷(Shiau-Ting Lee)

《技術學刊》 22卷4期 (2007/12) Pp. 335-341

https://doi.org/10.29507/JT.200712.0006

摘要

奈米碳管背光模組(CNT-BLU)因爲其材料成本低廉，已經被廣泛看好能取代現行以CCFL技術製造之大尺寸LCD背光模組。然而目前以厚膜網印製程所製造之CNT-BLU，其發光均勻度仍有待改進。這種新發光源之不均勻現象與傳統CCFL背光源不同，所以必須要有新的檢測方法與標準。本研究首先對現行平面顯示器亮度均勻度的檢測方式之於CNT-BLU的適用性作一探討。其次再針對CNT-BLU特有之光圈不均勻現象，發展了一套自動偵測與辨識並檢測的演算法。利用影像處理的方式，本方法可將CNT-BLU上的特殊光圈缺陷與背景值作最佳區分以突顯出光圈的位置，並據以計算出顯示平面光圈缺陷的量化嚴重程度。本研究結果可作爲後續改善CNT-BLU發光均勻度參數設計實驗之基礎。

關鍵字

背光模組 ； 奈米碳管背光模組 ； 亮度均勻度 ； 影像處理

並列摘要

The carbon nanotube backlight unit (CNT-BLU) has been considered as a strong candidate to replace the now dominating CCFL-based LCD backlight unit. Manufactured by thick film screen printing processes, the CNT-BLU has been evaluated to have cost advantages over traditional backlight products, especially for large size panels. However, products with such manufacturing processes still pose problems for emission uniformity. While the uniformity problems are different from CCFL-based backlight units, new methodologies that can be used to identify or to measure such problems need to be developed. This research aims at a type of uniformity defect that only occurs on CNT-BLUS called ”light rings”. Using image processing techniques, an automatic detection and measurement methodology is developed to locate and separate those light rings from the back-ground. A quantitative index can therefore be developed to measure the significance of the light ring defects on a CNT-BLU. The results of this research can serve as a basis to find the optimal parameters for CNT-BLU manufacturing.

並列關鍵字

backlight units ； CNT-BLU ； brightness uniformity ； image processing