超薄膜高分子作用力之量測

Measurements of Molecular Forces in Ultrathin Polymeric Films

楊長謀(Arnold Chang-Mou Yang) ； 張昱崙(Yu-Lun Chang) ； 童冠博(Guan-Bo Tung)

《科儀新知》 160期 (2007/10) Pp. 28-42

https://doi.org/10.29662/IT.200710.0003

摘要

藉由原子力顯微鏡(AFM)對除潤孔洞的表貌進行量測及彈性力學分析，可計算出薄膜中的分子鏈反彈力之值。同時研究高分子奈米超薄膜與軟基材在除潤時之交互作用，亦可得到作用在超薄膜上之分子總力大小。其減去分子鏈反彈力之後，即可得到薄膜毛細力。另外，由薄膜與軟基材之交互作用，可進一步瞭解基材之殘留應變與薄膜穩定度之間的關連。由本研究可以清楚的了解高分子奈米薄膜之分子反彈力與毛細張力之各種行為。藉由高分子薄膜除潤現象的觀察，可了解奈米尺度下高分子鏈的運動行為，對於建立整體高分子的分子理論基礎，提供重要的新知。

並列摘要

By studying the local topography of incipient dewetting holes with an atomic force microscope (AFM), the recoiling force could be calculated from the local stress release resulted from hole opening. The total force acting on the thin film was determined from the mechanical interactions between the ultrathin film and a soft substrate. The capillary force was then obtained by subtracting the measured recoiling force from the total force. Detailed study on the interactions with soft substrate revealed important relations between thin film stability and the residual strain in the substrate. The behavior of molecular recoiling force and the capillary force in polymer thin films can be understood from results obtained using this approach, which shed important new light on the relatively unexplored experimental chain dynamics on the mesoscopic scales.