高分子與軟質材料奈米結構之穿透式電子顯微鏡分析

Transmission Electron Microscopic Analysis of Nanostructures in Polymeric/Soft Materials

曾文賢(Wen-Hsien Tseng) ； 何榮銘(Rong-Ming Ho) ； 蘇安仲(An-Chung Su)

《科儀新知》 160期 (2007/10) Pp. 51-60

https://doi.org/10.29662/IT.200710.0005

摘要

於簡單回顧穿透式電子顯微鏡之基本成像與繞射原理後，我們針對高分子與軟質材料奈米結構之穿透式電子顯微鏡分析，在試片製作與儀器操作方式兩方面所需要特別注意的細節提出說明，並以文獻中報告之案例解釋相關技巧之實際應用。我們特別強調高分子與軟質材料之低對比與易於電子束下劣解之本質，並列舉實務上可以採取之對策。基於先前的使用經驗，我們對於專用於高分子與軟質材料之穿透式電鏡在硬體設備方面之恰當需求，也提出一些看法。

並列摘要

Basic principles of imaging and diffraction in transmission electron microscopy (TEM) are briefly reviewed. This is followed by more detailed methods of specimen preparation and instrumental operation for this particular category of materials, using published examples for demonstration purposes. Strong emphasis is given to fragile and low-contrast characteristics of polymeric/soft materials; typical strategies to overcome/by-pass the inherent difficulties in dealing with this category of materials are delineated. On the basis of our previous experiences, proper instrumental specifications for TEM instruments aimed at the exclusive use of morphological/structural characterization of polymers and soft materials are suggested.