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利用電子束微影技術完成奈米尺寸圖案

Implementing a Nano-Scale Pattern by the Electron-Beam Micro-lithography Technique

摘要


本研究主要以微影系統來定義出奈米等級的圖案。利用電子束阻劑應用於電子束微影上,並且以黃光製程製造出小於60奈米的線寬。使用電子束微影技術很輕易的便能製作出100 nm以下的結構,能將電子元件之線寬微縮至60 nm以下。本研究對電子束光阻在微影製程、蝕刻等特性做製程方面的探討並比較不同線寬之效應。

並列摘要


A nano-scale pattern has been defined by a micro-lithography technique. The resistance of an electron beam, NEB, is applied to electron-beam lithography, by which a 40 nm line-width structure was successfully fabricated. By using the electron-beam lithography technique, one can easily fabricate a 100 nm structure and reduce the line width of an electron device to below 60 nm. In this study, the characteristics of NEB resistance employed in micro-lithography and etching processes are investigated. In addition, the responses of different line widths have been compared.

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