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Early Validation Method for Reliability Growth Based on Environmental Stress Screening

利用環境應力篩選以早期驗證可靠度成長之方法

摘要


許多研究利用TAAF(test analyze and fix)計畫與DUANE模型作為進行可靠度成長的方法。在產品研發階段累積及分析相關可靠度試驗數據,即時監控產品的平均失效間隔時間(mean time between failure, MTBF),並追蹤產品可靠度成長狀況,使得產品在研發完成時可達到可靠度目標驗證。然而,過去進行可靠度成長試驗之前,必須先完成環境應力篩選 (environmental stress screening, ESS)試驗,此作法將耗費時間與成本。本研究提出一項可靠度驗證程序,首先在ESS試驗時進行TAAF以除去失效真因,再以修正之DUANE模型估計產品之MTBF。本研究利用個案分析與蒙地卡羅模擬來驗證所提出方法之有效性,研究結果顯示此方法確實可以有效地在早期設計階段驗證可靠度目標。

並列摘要


Most related studies have focused on the reliability growth validation methods of the TAAF (test analyze and fix) program and DUANE model. In the design and development phase, based on accumulated and analyzed test data, it monitors product reliability development with mean time between failure (MTBF), tracks product reliability growth, and completes reliability validation upon the completion of a design. In the past, growth validation testing was executed after ESS (environmental stress screening). However, it is time consuming and costly. In theory, ESS can only detect workmanship problems; but it can not detect design problems in early failure phase. During the design and development phase, ESS can identify many design problems. Such problems would not occur in subsequent tests if they are removed in early phases. In this study, a new validation procedure was proposed. First, we applied TAAF to eliminate root causes of failures during ESS. Then the modified DUANE model was used to estimate MTBF. The case study and Monte Carlo simulation were used to compare the effect of traditional method and proposed method. The results indicate that the proposed procedure can be served as a design basis to validate product reliability goal in early phase.

參考文獻


Crow, L. H., 1988, Reliability growth estimation with missing data. II, Proceedings of the Annual Reliability and Maintainability Symposium, 248-253.
Duane, J. T., 1964, Learning curve approach to reliability monitoring, IEEE Transactions on Aerospace, 2(2), 563-566.
Lloyd, D. K. and Lipow, M., 1977, Reliability: Management, Methods, and Mathematics, Lloyd, Redondo Beach, CA.
Regard, C., Gautier, C., Fremont, H., Poirier, P., Xiaosong, M. A., and Jansen, K. M. B., 2009, Fast reliability qualification of SiP products, Microelectronics Reliability, 49(9-11), 958-962.
United States Department of Defense, 1978, MIL-STD-1635(EC) -- military standard: reliability growth testing, Technical Report, United States Department of Defense.

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