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以二手產品置換之最佳置換時程與預防保養策略

OPTIMAL REPLACEMENT TIME AND PREVENTIVE MAINTENANCE FOR REPLACEMENT SECOND HAND PRODUCTS

摘要


隨著科技日新月異,產品競爭激烈,消費者追求潮流、新穎性產品與使用習慣改變等等,使得產品汰舊換新的頻率變高,導致市場流入大量的優值二手產品提供消費者選用。因此,除新產品外,二手產品成為消費者選用置換時的另一種選擇。本論文以消費者在產品規劃使用時程的期限下,選用二手產品來做一次性的產品置換。當初用產品或選用的替換產品在使用期間失效時皆以小修方式處理,在小修處理後,產品恢復堪用狀況但失效率維持不變。因選用替換的二手產品失效率較高,所以消費者規劃為二手產品實施預防保養來降低二手產品的失效率,減少產品失效時所帶來的維修費用。在上述的產品置換與維修保養策略下,本論文建構出以二手產品置換之期望總成本模式,並依據所建構之成本模式尋求產品的最佳置換時程、購買的二手產品最佳已使用之年限、及二手產品的最佳預防保養程度與次數。

並列摘要


This paper investigates the optimal replacement time and preventive maintenance policy for products replaced by second-hand products. During a finite planning horizon (FPH), suppose that the consumer initially uses a new product at beginning and the product is replaced once by a second-hand product at a pre-specified time epoch. Any failure of the product is rectified by a minimal repair. To reduce the number of failures caused by the second-hand product, a periodical preventive maintenance (PM) policy is performed. Under this maintenance strategy, the mathematical model of the total expected cost for the products during the FPH is derived, and then the optimal replacement time, used age of the second-hand product, and the PM policy are obtained such that the expected total cost is minimized. The property of the optimal replacement time, used age of the secondhand product, and the PM policy are investigated and some numerical examples are provided to illustrate the performance of the optimal policy.

參考文獻


Barlow, R.,Hunter, L. C.(1960).Optimum preventive maintenance policies.Operations Research.8(1),90-100.
Barlow, R. E.,Proschan, F.(1965).Mathematical Theory of Reliability.New York:Wiley.
Brown, M.,Proschan, F.(1983).Imperfect repair.Journal of Applied Probability.20(4),851-859.
Chien, Y. H.,Sheu, S. H.(2006).Extended optimal age-replacement policy with minimal repair of a system subject to shocks.European Journal of Operational Research.174(1),169-181.
Jack, N.,Dagpunar, J. S.(1994).An optimal imperfect maintenance policy over a warranty period.Microelectronics and Reliability.34(3),529-534.

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