Based on the wordlength pattern (WLP), resolution and minimum aberration are the two most useful criteria for choosing a good two-level fractional factorial experiment. Using geometrical designs and complementary theory, this paper develops the closed-form formulae of WLP for saturated resolution IV (R-IV) and R-III designs with any run size to overcome the tedious calculation of large-scale design and provide some theoretical background. We also use inductive proof to explore the relationships between and within two saturated designs. These results can be used to develop closed-form formulae of WLP for other special designs.