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簡易型PC-Based Curve Tracer之研製-以二極體電壓電流特性曲線之測量為例

Design and Implementation of Simplified PC-Based Curve Tracer-A Demonstration for Measuring the I/V Characteristic Curve of the Diode

摘要


IC生產線上的測試人員,經常需要精密設備去測量半導體元件的電壓電流特性,做為修正製程參數的依據,而Curve Tracer是這類設備的常用選項。但是,當測試人員只需判定元件的好與壞,而非獲得精準的測量數據,此時Curve Tracer就顯得大材小用;再者,購置Curve Tracer所費不貲,也非測試人員想要即有的配備。基於以上兩點,有了研發簡易型Curve Tracer的動機。我們利用低成本的電路元件研製了一個電路雛形,搭配自製的電腦人機介面,可描繪出二極體的電壓電流特性曲線,讓測試人員輕鬆判定二極體的好壞。

並列摘要


Test engineer of IC production line often requires precision equipment to measure the voltage and current characteristics of semiconductor components, and the process parameters can be adjusted by the results of measurement. Usually the Curve Tracer is a suitable option of equipment to fulfill the above need. However, when the test engineer simply want to discriminate between the good and the failed components, rather than to obtain the precise data of measurement, using the Curve Tracer is just like using a sledgehammer for cracking a nut. Moreover, the Curve Tracer is very costly - not a common equipment for the personnel of a production line. Inspired by the above two points, we started to create a simplified PC-based Curve Tracer. We have implemented a circuit prototype with low budget, which can do the needed measurement for discrimination of diodes. The I-V characteristic curve of the diode can also be shown on screen by a custom computer program, which allows the test engineer to easily determine the device is good or broken.

參考文獻


Sedra, Adel S.,Smith, Kenneth C.(2011).Microelectronic Circuits.USA:Oxford.
Sabnis, Anant G.(1990).VLSI Electronics Microstructure Science: VLSI Reliability.San Diego:Academic Press.
Alexander, Charles K.,Sadiku, Matthew N. O.(2014).Fundamentals Electric Circusit.USA:McGraw-Hill.
Haykin, Simon,Van Veen, Barry(2003).Singals and Systems.USA:John Wiley & Sons.
Mitra, Sanjit K.(2011).Digital Signal Processing:A Computer-Based Approach.USA:McGraw-Hill.

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