Stochastic Diffusion Modeling of Degradation Data

Sheng-Tsaing Tseng ； Chien-Yu Peng

《Journal of Data Science》 5卷3期 (2007/07) Pp. 315-333

https://doi.org/10.6339/JDS.2007.05(3).351

並列摘要

Accelerated degradation tests (ADTs) can provide timely reliability information of product. Hence ADTs have been widely used to assess the lifetime distribution of highly reliable products. In order to properly predict the lifetime distribution, modeling the product's degradation path plays a key role in a degradation analysis. In this paper, we use a stochastic diffusion process to describe the product's degradation path and a recursive formula for the product's lifetime distribution can be obtained by using the first passage time (FPT) of its degradation path. In addition, two approximate formulas for the product's mean-time-to-failure (MTTF) and median life (B50) are given. Finally, we extend the proposed method to the case of ADT and a real LED data is used to illustrate the proposed procedure. The results demonstrate that the proposed method has a good performance for the LED lifetime prediction.

並列關鍵字

Accelerated degradation test ； degradation test ； first passage time ； stochastic diffusion process