In reliability testing, weibull distribution is widely used to analyze the lifetime of electronic products. Weibull Probability Plot (WPP) and Maximum Likelihood Estimator (MLE) were often applied to estimate the weibull parameters. In this study, we focus on the accuracy evaluation of parameter estimation of WPP and MLE, then we use simulation approach to examine the estimating performance for different sample sizes and censoring ratios. From the simulation results, we suggest that WPP is a better choice in this complete data case. In the censoring data cases, MLE can obtain more accurate weibull parameter estimations than WPP. If the serious censoring ratio was occur, WPP would have higher estimating error, and we do not suggest WPP is used in this case. Finally, an accelerated testing example of TFT LCD module is illustrated the application of this study result.