Constructing a two-plan sampling system based on process yield index

Shih-Wen, Liu ； Kuei Lin, Chen

《創新與經營管理學刊》 8卷2期 (2019/10) Pp. 77-86

https://doi.org/10.6270/JIBM.201910_8(2).0006

摘要

An individual sampling procedure works simply and intuitively for the examiner to conduct a lot sentencing against the submission based on the required tolerable risks and yield. However, the relevant literature concludes that the conventional single plan may need more samples for inspection and may be incapable of fitting the unexpected deterioration of the submitted quality. By applying a switching rule, we develop a two-plan sampling system based on process yield index involving normal and tightened inspection for the purpose of sample size reduction and providing a flexible method for lot determination. The result shows the effectiveness of the proposed method according to its smaller sample size for inspection and can provide a better discriminatory power under the same settings. We also tabulate the solved parameters for the practical application in the real world.

關鍵字

acceptance sampling plan ； tightened inspection ； quality deterioration ； switching rule