本文主要是利用光學受挫式全反射方法和新樣式的Kretschmann組態(砷化鎵稜鏡─銀金屬薄膜─綠茶)為基礎(原Kretschmann創始基本組態是:玻璃稜鏡─金屬薄膜─空氣)激發金屬表面電漿波對本研究量測物質─綠茶之研究。我們的研究方法除了根據光學受挫式全反射方法與激發金屬表面電漿波之Kretschmann組態外,也參考了Kretschmann,E.於1971年後,陸續所發表之論文的理論、量測金屬表面電漿波的光學實驗架構、三層反射率公式及MATLAB軟體進行整個研究。本文主體研究是藉由不同銀金屬薄膜厚度變化進行電腦模擬,並找出本新樣式的Kretschmann組態激發表面電漿波時之最佳化銀金屬薄膜層厚度,並對整個模擬結果作深入分析與探討。本研究結果顯示,量測物質綠茶在本新樣式的Kretschmann組態銀薄膜厚度55(nm)時,具有最佳檢測響應;即本研究組態在銀薄膜厚度55(nm)時,所產生的表面電漿波具有深且窄的最佳化表面電漿波共振角。
This present study used optical frustrated total internal reflection method and the new style of Kretschmann configuration (GaAs Prism - silver Metal film - green tea) basis (Kretschmann founding basic configuration is: Glass Prism - Metal film - air) to excite metal surface plasma waves to measure substance of green tea. In addition to the total reflection type optical frustrated Kretschmann configuration and the excited metal surface plasma wave methods, this study referred other theory (Kretschmann, E. 1971) used successfully in optical experiments to measure the metal surface structure of the plasma wave, which were combined with three reflectance formulas and MATLAB software in this study. The entire simulation results were also simulated by MATLAB for further analysis and discussion. Finally, the results of the study showed that the optimum detector response of the green tea substance was measured in the new style of the silver thin film Kretschmann configuration at thickness 55 (nm); Namely, the present study configured in the surface plasma wave of the silver thin film thickness 55 (nm) produced deep and narrow optimum plasma surface wave resonance angle.