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Fluctuation in the Surface Morphology of DNA-wrapped Carbon Nanotubes Studied by Continuous Cross-sectional Analysis of Atomic Force Microscopy Image

並列摘要


Continuous cross-sectional analysis of atomic force microscope (AFM) images of several types of hybrids of DNA and carbon nanotubes (CNT) has been demonstrated. When conventional cross-sectional analysis was employed, the difference in surface roughness between chemical vapor deposition (CVD)-produced single-walled nanotubes (SWNTs) and high-pressure carbon monoxide (HiPco)- produced SWNT could not be distinguished. However, when continuous cross-sectional analysis was carried out using homemade software, greater fluctuation in surface roughness of DNA-HiPco SWNT hybrids was clearly quantified. Although hybrids of DNA-CNT have been studied intensively, fluctuation of surface morphology has not been well studied yet. Our results give useful information to understand the structures of DNA-CNT hybrids.

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