Application of Dynamic Supply Current Monitoring to Testing Mixed-Signal Circuits

MAHMOUD A. AL-QUTAYRI ； PETER R. SHEPHERD

《VLSI Design》 1997卷 (1997/12) Pp. 223-240

https://doi.org/10.1155/1997/47423

摘要

This paper applies the time-domain testing technique and compares the effectiveness of transient voltage and dynamic power supply current measurements in detecting faults in CMOS mixed-signal circuits. The voltage and supply current (i_(DDT)) measurements are analyzed by three methods to detect the presence of a fault, and to establish which measurement achieves higher confidence in the detection. Catastrophic, soft and stuck-at single fault conditions were introduced to the circuit-under-test (CUT). The time-domain technique tests a mixed-signal CUT in a unified fashion, thereby eliminating the need to partition the CUT into separate analogue and digital modules.

關鍵字

CMOS ； VLSI ； mixed-signal ； supply current ； testability ； fault coverage