This work deposited thin film materials by a low pressure chemical vapor deposition system on substrates. By using MX_n (M=Ti, Ta. Ge, X=F, CI) and SiF_2 as the precursors, the deposition reaction occurred at a temperature exceeding 500°C. According to our results, the composition of thin films is a MSi related to the precursors used. The total reaction pathway was studied in detail. On other hand, polycrystalline titanium carbides were deposited by using C_2Cl_6 and titanium metal plate as the precursors, the carbonization reactions occurred at a temperature exceeding 800°C. Furthermore, the total reaction pathway was closely examined as well.