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分散式半導體NPW回收系統效能分析

摘要


在晶圓製造廠中,由於製程設備的投資高昂,折舊時間短,於是增加機台的產能利用率成為晶圓廠的重大目標之一,而製程機台是否能持續穩定產出,關鍵在於機台擋控片的使用,確保能夠穩定機台的生產環境並即時監控機台的生產數據,以減少產品的不良率。對半導體生產來說,自動化生產已經是不可抵擋的趨勢,而對擋控片的回收,雖然現有依需求來設計的晶圓蒐集機台,但實務上使用卻不勝理想。本研究提出一套分散式晶圓儲存系統來執行並管理擋控片的回收流程,在經過實際晶圓製造廠的實驗後,證明本研究不僅可完整取代晶圓蒐集機,執行擋控片的晶圓回收,並改善了工廠內的整體的自動化系統傳輸效率。

並列摘要


Due to the high cost and high depreciation rate of fabrication equipment, improvements in efficiency have become a priority to wafer fabrication plans. The key to sustaining stable production is the utilization of control and dummy wafer, procuring a reliable environment and real‐time monitoring production data for equipment, to minimize fraction defective. While automated production has become essential in semiconductor production, it have been developing wafer‐retrieving devices according to the demands. The performance in practice is rather unsatisfactory though. A distributed wafer‐recycling system is presented in this study, which is to aid the management in control wafer re‐utilization. Results from experiments under practical production have shown promising improvements in wafer retrieval, replacing current wafer‐retrieving devices, and also in distribution of wafers thereof.

並列關鍵字

NPW Recycle Wafer Collector Wafer Bank System

被引用紀錄


陳欣郁(2012)。產業供應鏈下具不可追蹤及雙向鑑別之RFID認證之研究〔碩士論文,淡江大學〕。華藝線上圖書館。https://doi.org/10.6846/TKU.2012.00376

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