行奇偶與列選擇:內建自我測試之多掃描鏈環境下多重錯誤之診斷技術

Column Parity and Row Selection (CPRS): A BIST Diagnosis Technique for Multiple Errors in Multiple Scan Chains

林鴻貿(Hung-Mao Lin)

指導教授 ： 李建模

國立臺灣大學/電機資訊學院/電子工程學研究所/碩士(2005年)

https://doi.org/10.6342/NTU.2005.01472

摘要

在本論文中，新的內建自我測試診斷技術被用於診斷多掃描鏈環境下之多重錯誤。在此技術中，每次掃描鏈輸出一組數據時，線性反饋移位暫存器會遮蔽部分數據。沒被遮蔽的數據，便被用於產生一組行奇偶與一組列奇偶。在每組掃描鏈數據輸出時，一個列奇偶便被產生。在簽名輸出時，行奇偶便被輸出。此技術也支援決定診斷。此技術在沒有未知數出現時，可以完全正確地診斷出錯誤所在點。而在有百分之一未知數出現情況下，此技術仍可以正確診斷出錯誤值地點。而此技術所需要的成本，只包含多餘的面積和額外的輸出接腳。

關鍵字

行奇偶 ； 列選擇 ； 多掃描鏈 ； 多重錯誤 ； 內建自我測試 ； 診斷

並列摘要

In this thesis, a BIST diagnosis technique is presented to diagnose multiple errors in multiple scan chains. An LFSR randomly selects outputs of multiple scan chains every scan cycle. The column parity and row parity of the selected scan outputs are observed every scan cycle and every scan unload, respectively. The deterministic diagnosis of multiple scan chain is also supported. In the absence of unknowns, CPRS correctly diagnoses all errors within 15 diagnosis sessions. Compared with other techniques, which diagnose no more than 15% errors, CPRS correctly diagnoses all errors in the presence of 1% unknowns. The cost of this technique is area overhead and one additional output observed every scan cycle.

並列關鍵字

Column Parity ； Row Selection ； CPRS ； BIST ； Diagnosis ； Multiple Errors ； Multiple Scan Chains

參考文獻

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