以加速測試評估電子構件壽命─揉合失效率與反應速率之非穩態分析模式

Life Assessment of Electronic Components based on Acceleration Life Test and in Consideration of both Failure Rate and Reaction Rate

詹鵬安(Peng-An Chan)

指導教授 ： 吳文方

國立臺灣大學/工學院/機械工程學研究所/碩士(2010年)

https://doi.org/10.6342/NTU.2010.03540

摘要

為因應產業競爭與技術發展，產品、尤其是電子產品或其組件的加速測試或增壓試驗有其重要性，透過此類測試，我們可獲得產品或組件的失效數據，再透過適當的物理分析模型，估算產品或組件在正常環境下的壽命與可靠度。以常見電子構件增壓測試為例，此物理分析模型稱作加速模型，該模型應用到「化學反應速率」的概念，但為簡化分析，通常假設該反應速率為不隨著時間變動的定值，其與事實並不盡相符，因此本研究沿用可靠度工程中非穩態失效率的觀念，將反應速率視為一隨失效率變化的非定值參數，並在適當的假設下，推導出具非穩態失效觀點的壽命估算公式，再將其應用於連接器加速測試所得數據的分析，期能評估連接器在正常環境下的壽命。分析結果顯示，此非穩態失效觀點的壽命分析模式確能降低評估結果的不確定性，並增進分析結果的可信度。

關鍵字

增壓測試 ； 加速模型 ； 反應速率 ； 失效率 ； 非穩態失效

並列摘要

Nowadays, due to the growing industrial competition and technological developments, accelerated tests and compressed-stress tests are essential to evaluate lives and reliabilities of electronic products. By using these tests, researchers can obtain data to evaluate through certain physical models the lifetimes and reliabilities of products and components when they are used in normal condition. Taking the compressed-stress test of electronic components for instance, a frequently used physical model is called the acceleration model. It adopts the concept of “reaction rate” originated from chemistry studies. To simplify the computational process, it is common to assume the reaction rate is a constant although the assumption may not be reasonable enough. To remedy it, a non-constant chemical reaction rate is proposed in the present study. The rate is considered a function of the non-steady-state failure rate used in reliability engineering and it thus becomes a function of time. Based on this concept, formulas are derived for us to evaluate a component’s lifetime when it is used in normal condition. The proposed method is then applied to the accelerated test result of a certain type of electronic connector in order to evaluate its lifetime when it is used in a normal condition. The result indicates the proposed method does reduce the uncertainty of evaluation and enhance reliability of the output.

並列關鍵字

compressed-stress test ； acceleration model ； reaction rate ； failure rate ； non-steady-state failure

參考文獻

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29. 劉明偉，電子連接器之失效分析與可靠度評估，國立台灣大學機械工程研究所碩士論文，民國98年。

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