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  • 學位論文

Gompertz分配產品之壽命績效的評估

Assessing the lifetime performance for the products with Gompertz distribution

指導教授 : 吳錦全

摘要


近年來,製程能力指標被製造業廣泛的應用在品質監控方面,以評估製程 能力是否合乎水準。大多數的製程能力指標都是假設產品的品質特性在常態分 配下;然而,產品壽命往往是服從非常態分配,例如:指數分配、柏拉圖分配、 韋伯分配等等。對於產品壽命之相關分配,在實務上會利用壽命績效指標L C 來 衡量產品的壽命績效,其中L 是規格下界。在壽命試驗中常因時間限制以及人 力和成本的考量而無法取得完整的樣本資料,使得必須使用設限樣本資料。 本文主要目的是利用產品壽命具有Gompertz 分配之右型Ⅱ設限樣本, (1) (2) ( ) , , , k X X " X ,來評估壽命績效指標L C ,並且利用L C 的最大概似估計量發展 一個新的檢定程序與信賴區間。此外,也利用產品壽命來自一個具有雙參數指 數分配之右型Ⅱ設限樣本,建構出壽命績效指標L C 的信賴區間。利用此檢定程 序與信賴區間,可以提供廠商評估產品壽命是否達到要求水準。

並列摘要


In recent years, many process capability indices (PCIs) have been widely used in quality monitoring by many manufacturing industries. Most PCIs assume that the quality characteristic has a normal distribution. However, the lifetime of products frequently possesses an exponential distribution, a Pareto or Weibull distribution etc.. In practice, the lifetime performance index L C is utilized to measure lifetime performance for products with some lifetime distributions, where L is the lower specification limit. In lifetime testing experiments, we may not be able to obtain a complete sample due to time limitation or other restrictions. Therefore, censored samples arise in practice. This research constructs a maximum likelihood estimator (MLE) of L C based on the right type Ⅱ censored sample from the Gompertz distribution. The MLE of L C is then utilized to develop a new hypothesis testing procedure and the confidence interval in the condition of known L . In addition, the confidence interval of L C is also constructed for the two-parameter exponential distribution with the right type Ⅱ censored sample. The purchasers can then employ the new hypothesis and the confidence interval to determine whether the lifetime performance of products adhere to the required level.

參考文獻


performance assessment system for Weibull lifetime product,
[1] Balakrishnan, N. and Cohen, C. A. (1991), Order Statistics and
Inference, Academic Press, Inc.
[2] Boyles, R. A. (1991), The Taguchi capability index. Journal of
Quality Technology, 23, pp. 17-26.

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