具累積損害過程之恆定應力加速退化測試

Constant-Stress Accelerated Degradation Tests under Cumulative Damage Process

宋依玲(Yi-Ling Sung)

指導教授 ： 蔡宗儒

淡江大學/管理學院/統計學系碩士班/碩士(2011年)

https://doi.org/10.6846/TKU.2011.00809

摘要

為了在有限的時間內推估高功率LED 晶粒的可靠度, 本論文使用雙應力變數對高功率LED 晶粒進行恆定應力加速退化測試實驗。假設加速退化實驗所收集的元件之累積損害退化資料服從Wiener 隨機過程, 我們建議以逆高斯分配建立了加速退化模型, 進而推導出產品壽命百分位數的點估計值及信賴下界。本文並以高功率LED 晶粒退化資料實例來說明本方法之應用。

關鍵字

加速退化檢定 ； 累積損害過程 ； 逆高斯分配 ； Wiener 隨機過程

並列摘要

It is difficult to evaluate the lifetimes of high reliable products in limited experimental time. In this thesis, statistical methods based on a two-variable constant-stress loading accelerated degradation test are developed to overcome this difficulty. Assuming the cumulative damage information of test units due to degradation has a Wiener process, the inverse Gaussian distribution is used to derive the lifetime percentiles and their low confidence bounds. A real example of LED chips data set is used to demonstrate the application of the proposed method.

並列關鍵字

Accelerated degradation test ； Cumulative damage process ； Inverse Gaussian distribution ； Wiener process.

參考文獻

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[7] Lim, H. and Yum, B.J. (2011). Optimal design of accelerated degradation