陽極螢光粉體表面處理對平面電子發射光源影響之研究

平面電子發射光源(Flat Electron Emission Lamp，FEEL)技術為工研院綠能所原創之新型無汞平面發光光源，其工作原理是利用氣體放電的方式產生一電子激發源，藉由電場吸引下撞擊螢光粉，致使陽極螢光粉均勻發光。經研究發現，影響FEEL發光效率的主要因素有氣體參數、電極材料、螢光粉三大因素。本研究將針對低電壓硫化鋅螢光粉進行探討；依文獻指出，螢光粉材料於電子穿透深度較淺的環境下，其發光效率會因為螢光粉表面雜質、非發光層與粉體導電性而有明顯的變化。因此，本實驗藉由不同濃度酸蝕製程、元件製程條件對硫化鋅系螢光粉進行表面優化；此外，添加奈米級導電粉體改善螢光粉層導電性。最後分析不同製程下對螢光粉表面性質之影響，探討其微結構變化與物理化學機制；並且比較其中光電轉換效率之優化程度。實驗結果顯示，由於螢光粉母體材料易於高溫環境下與氧進行反應，使得硫化鋅元素劣化，發光效率因此下降。利用不同的高溫製程可以減少氧化物於螢光粉表面的生成；此外也可以藉由製程的手法，抑制氣態硫酸根的揮發達到保護粉體的效果。此外，藉由硝酸進行蝕刻，在3m莫爾濃度下可以達最佳的效果，其效率可以獲得約40%的效率提升。

關鍵字

平面電子發射光源；硫化鋅螢光粉；陰極發光效率

並列摘要

FEEL(Flat electron emission Lamp) technology of new mercury-free flat light is originally from ITRI. The working principle, resulting in uniform light-emitting, is the gas discharge to generate an electronic excitation source which increases the drift velocity of electron by the electric field then hit the phosphors. In early study, we found three major factors (the gas parameters, electrode materials and phosphors) that affect the FEEL luminous efficiency. This study will discuss zinc sulfide phosphor at low voltage. According to the references, it indicates that on the condition which electrons penetrate shallower depth, impurities on the surface of the phosphor, non-light-emitting layer and conductive powder will influence the light-emitting efficiency. This experiment is to optimize efficiency with different concentrations of acid-etching process and the surface conditions of zinc sulfide phosphor in FEEL device process. In addition, a nano-scale conductive powder added to phosphor is to improve the conductivity of the phosphor layer. Finally, analysis of different processes on the surface properties of the phosphor is to explore the micro-structural changes in the physical and chemical mechanisms and to compare the quality of optimization of the photoelectric conversion efficiency.

並列關鍵字

FEEL ； ZnS Phosphor ； Cathodoluminescence

參考文獻

[6] Lyuji Ozawa, “Electron flow route at phosphor screens in CRTs”, M. Chem. Phys. v73,2002, p144-150.

[7] C. Curtin, “The Field Emission Display: a new flat panel technology”, IEEE, 1991, pp.12-15.

[8] A. Ghis, R. Meyer, P. Rambaud, F. Levy, and T. Leroux,“Sealed Vaccum Devices: Fluorescent Microtip Displays ” IEEE transactions on electron devices, 38, 1991, pp.2320-2322.

[10] K. W. Park, H. S. Hwang, M. H. Han, H. K. Baik, K. M. Song, Appl. Phys. Lett. 92, 2008,061502 .

[11] J. P. Boeuf, J. Phys. D: Appl. Phys. 36, 2003, R53.

國際替代計量

陽極螢光粉體表面處理對平面電子發射光源影響之研究

全文下載

主題瀏覽