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  • 學位論文

以公理設計方法改善TFT-LCD面板瑕疵檢測程序

Applying Axiomatic Method to Improve TFT-LCD Visual Defect Inspection Procedures

指導教授 : 梁曉帆
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摘要


隨著資訊時代的來臨,影像顯示器的應用愈來愈廣泛,其中以薄膜電晶體液晶顯示器(TFT-LCD)產業發展最快,自1999年以來,TFT-LCD產業已成為台灣光電產業的火車頭,並與日本和韓國並列為主要TFT-LCD面板生產國家。所以,薄膜電晶體液晶顯示器已逐漸成為平面顯示器的主流,且TFT-LCD的影像品質也愈來愈受重視。雖然TFT-LCD產業已運用大量的自動化技術於製程中,但目前在面板的瑕疵檢測,製造商仍仰賴有經驗、技巧的檢測人員來評估。但是,由於面板的瑕疵種類眾多,且難以辨識,檢驗員必須於訓練時熟記各種不良的現象、檢查的畫面、和等級規格等等;因此,對檢驗員而言,面板的檢測流程是相當複雜的程序。本研究對於人工視覺瑕疵檢測流程進行評估與分析,能使現有複雜的檢驗程序系統化;另外,利用公理設計原則的獨立公理,找出較符合專家檢測員心智模式的瑕疵檢驗,以協助檢測員從事繁複的檢測工作。實驗結果顯示,透過公理設計原則的方法,得到面板檢測畫面的層級,並可透過層級來改善面板檢測畫面的程序,提升檢測績效;也得知有兩個檢測畫面可以刪除,六個檢測畫面檢測瑕疵數目可以減少,使檢測時間縮短。本研究建議工程師可以藉由不同種類的檢測畫面排列組合,找出最適合檢驗員的順序,使檢驗員能以最有效的方式,找到所有可能的面板瑕疵,進而提升檢測績效。

並列摘要


As information age comes, the applications of display technology, especially the TFT-LCD, are widespread. In 1999, the TFT-LCD industry has become main sector of flat display panels industry in Taiwan. Together with Japan and Korea, Taiwan has become one of the leading countries which produce TFT-LCD. Although lots of automatic techniques have been put into practice, the defect inspection of TFT-LCD panels still relies heavily on experienced and skillful inspectors. However, due to varieties of panel defects that are hard to recognize, inspectors have to memorize a large number of instructions, patterns, and specifications. Thus, the defect inspection procedure is complicated for them. The purpose of this study is to analyze human visual defect inspection procedures by using the independence axiom of axiomatic design technique to find a better inspection procedure which corresponds to the knowledge structures of expert inspectors. Through the axiomatic design, the hierarchy of panel inspection patterns can be defined and used to further improve the procedure of panel inspection patterns and enhance the performance. It showed that two inspection patterns can be eliminated and the number of the to-be-inspected defects on six inspection patterns can be reduced for saving inspection time. It is suggested that the inspectors’ mental models on defect categorization can be used to find out the most suitable sequence of inspection procedures by rearranging those inspection patterns, so that eventually the inspection performance can be enhanced.

參考文獻


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