本論文運用Berreman矩陣運算法來描述光在雙折射材料中的傳播行為,並藉由此運算法來探討偏極轉換現象在非均向薄膜中形成的原因。 在稜鏡耦合組態(稜鏡�非均向薄膜�空氣)這種可增強偏極轉換的系統下,利用Berreman矩陣運算法逐步分析在(均向�晶體)界面、(晶體�均向)界面的反射及透射係數以及在非均向薄膜中的尋常光與非尋常光,觀察以上的透射率、透射係數相位變化來判別在不同材料、入射角以及改變沉積平面夾角時的偏極轉換主要成因。 實際上代入(稜鏡�低折射率非均向薄膜(二氧化矽)�空氣)討論,在偏極轉換率較高的入射角度以及偏極轉換率較低的入射角度進行偏極轉換成因的對照,然後再替換成高折射率非均向薄膜(二氧化鈦)進行討論。
In this work, we describe the propagation behavior of wave in the birefringence material by Berreman calculus, and use it to confer what the reason to form the phenomenon of polarization conversion in the anisotropic thin film. The polarization conversion reflection (PCR) can be enhanced in the prism-coupling configuration (prism�anisotropic thin film�air). We use the Berreman calculus to gradually analysis the reflection coefficient, transmit coefficient and the distribution of electric- magnetic field at isotropic-crystal interface and crystal-isotropic interface, then watch out for the e-ray and o-ray in the anisotropic thin film. To observe above-mentioned variation of intensity and phase, we can differentiate what is the main factor about polarization conversion。 Reality, we substitute low refractive (SiO2) anisotropic thin film to consider taking a contrast for the cause of polarization that conversion between the incident angle of higher polarization conversion reflection and the lower one. And then, we substituted for high refractive (TiO2) anisotropic thin film once again。