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  • 學位論文

應用於電刺激晶片之無探針式測試系統

Probeless IC Testing System for PRF Stimulator

指導教授 : 邱弘緯
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摘要


近年來生醫產業的快速發展,電刺激器的誕生更是醫學上創新的突破,而本論文所設計的電刺激器是以未來能夠植入人體中為目的,利用電感耦合的原理,並透過無線的方式將能量傳到電刺激器之中,使電刺激器能輸出一個可應用在電刺激治療的PRF電刺激訊號,其脈衝刺激時間為20ms,且強度大小是可以控制。但是考量到未來必須植入於人體之中,所以必然會碰到下列兩個困難點: 1.電刺激器植入人體中之尺寸必須很小,但這造成晶片測試上會遇到困難。 2.電刺激器封上一層生物相容的膠之後,無法確認其功能是否正常。 為了解決上述的問題,設計了一個無探針式的測試系統,而此系統利用 電感耦合的方式來傳遞訊號,其可分成發射端和接收晶片兩部分,發射端部分有E類功率放大器以及將接收晶片所回傳之資料還原的電路,接收晶片的部份包含了電源管理電路,訊號接收與測試訊號產生電路,待測物電路,回傳與控制電路,而此系統能夠測試數位和類比的訊號,並能將結果利用封包透過無線的方式做回傳,而此系統獲得能量的方式則是透過光線的照射,讓光電二極體作為系統的電力來源,而由量測的結果得知此方法的可行性極高。本論文中的PRF電刺激晶片以及無探針式測試系統晶片皆是採用TSMC 0.18μm 1P6M CMOS製程製作。

並列摘要


In recent year, biomedical and biological researches are vigorously growing. The innovation of this stimulator is greatly considered a creative breakthrough in medication. In this thesis, our purpose is to implement a implanted PRF stimulator. PRF stimulator is utilizing a coupling coil to realize a power transmission wirelessly, and the stimulator can deliver a PRF(Pulsed Radio frequency) waveform with 500KHz carrier frequency , 20ms stimulation duration, and it’s intensity is controlleable. Owing to implantion of this stimulator inbody, the following problems must be encounterd and shall be solved: 1.The size of implanted stimulator must be much smaller, but it causes a difficult problem in IC testing. 2.Implanted-stimulator is overally covered by Parylene, so can be not observed its function by exterior surface. In orde to solve these problems, a probeless IC testing system is designed. This system is operated by utilizing a coupling coil to realize a signal transmission wirelessly, and it can be divided into the transmitter part and receiver chip. In transmitter part,a Class-E power amplifier transmits energy and use IC U2207B to transfers the chip information. In receiver chip, it includes power management circuit, signal receiver, function generator, circuit under test, trasmitter and controller. This system can test digital and analog signals,and then send the testing result which is packaged by logic controller back to the transmitter part wirelessly. The supply voltage of reciver chip is generated by photo diode and the measurement result shows the high feasibility of this system. In this thesis, PRF stimulator and probeless IC Testing System are fabricated by TSMC 0.18 um 1P6M CMOS technology.

參考文獻


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