電池保護積體電路測試系統之實務研究

The Practical Research of Battery Protection Integrated Circuit Testing System

朱劍英(Chien-Ying Chu)

指導教授 ： 黃育賢

國立臺北科技大學/電資學院/電資碩士班/碩士(2013年)

https://doi.org/10.6841/NTUT.2013.00686

摘要

近年來，類比電源半導體開發公司都需面對快速研發產品及提升投資獲利等基本問題，還需面臨如何降低半導體測試成本、縮短開發測試模組時間及提高驗證準確度等難題。因此，產業界都會採用ATE（Automatic Test Equipment）專業半導體測試系統平台進行IC測試工程開發，來解決上述難題。半導體測試工程雖然在整個半導體製程中屬於後端工程階段，但此階段為決定產品良率及品質的重要關鍵，其目的可降低封裝成本損失及確保產品符合客戶端規範。
本論文運用ASL1000半導體測試機，搭配電池保護IC產品，針對測試開發流程與IC功能測試方法進行討論，包括基本直流測試、過充檢測電壓與檢測時間測試、輸入阻抗測試、臨界值測試及輸入與輸出電流測試等驗證設計。結合實務案例設計開發，說明測試程式的撰寫、負載電路板及待測物電路板的設計製作及相關注意事項，至最後測試計劃的擬定及測試工程的實現與驗證。

關鍵字

ATE ； 半導體測試 ； IC測試 ； 電池保護 ； 測試系統

並列摘要

In recent years, the analog power semiconductor development companies are required to face some basic questions, like faster product development and enhancement of the investment profit. Otherwise, there are some challenges, such as how to reduce the cost of semiconductor test, shorten development time and improve the verification accuracy. Therefore, industry adopts ATE (Automatic Test Equipment) the professional semiconductor testing system platform to develop the IC test engineering. The semiconductor test engineering in the semiconductor manufacturing process belongs to the back-end project phase, but this phase is important for yield rate and quality. It can reduce the packaging costs and make sure that the products conform to the specifications of the client. This thesis uses ASL1000 test machine with battery protection IC products to discuss the IC function test and the test development process, including basic DC test detection time, overcharge detection voltage and critical values of input impedance test, and test validation of input and output current design.
This thesis includes the design and development case, interpreting the development of the test program, the design and the implementation of the load circuit board and the DUT circuit board, and the related considerations. At last, we draft the test plan, accomplish and verify the test engineering.

並列關鍵字

ATE ； Semiconductor Test ； IC Test ； Battery Protection ； Test System

參考文獻

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