篩選驅動訊號不良,在TFT-LCD模組老化製程

To Sieve Out Driving Signal in TFT-LCD Burn-in Processes

林鑫立(Chin-Li Lin)

指導教授 ： 張明文

元智大學/電機通訊學院/電機工程學系/碩士(2008年)

https://doi.org/10.6838/YZU.2008.00001

摘要

本論文的設計理論，運用模組老化製程中Pattern Generator Card驅動TFT-LCD訊號的動作原理，擷取出其主要的驅動訊號，並判斷比對Pattern Generator Card所輸出的訊號是否正常。使用比較器、及閘組合的判斷電路，再經過訊號轉換電路，將輸入的類比訊號轉換成數位訊號，透過Micro IC所撰寫的程式來判斷。
　　在使用Pattern Generator Inspect Card後，TFT-LCD顯示異常的不良率從改善前的43%降到17%，明顯改善了60%，其改善效果非常顯著。

關鍵字

液晶顯示器,老化製程,驅動電路

並列摘要

Present paper design theory , Pattern Generator Card actuates the TFT-LCD signal using the Module Burn-in Process regulation in the movement principle,Picks up its main actuation signal, and judges the signal which outputs to Pattern Generator Card is whether more normal than.Uses judgment electric circuit which the comparator, and the AND , Again passes through the signal switching circuit, Will input analogy signal transformation digital signal, Penetrates the formula which Micro IC composes to judge.
　　After uses Pattern Generator Inspect Card, TFT-LCD demonstrated the unusual fraction defective 43% falls 17% from the improvement, Improved 60% obviously, its improvement effect is extremely remarkable.

並列關鍵字

Liquid-Crystal Display ,Burn-in Process, Actuate the Electric Circuit

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