光學多重反射與透射法運用在磁頭與磁碟之間間隙量測

Optical Multiple Reflection and Transmission Measurement Used Slider-Disk Spacing

蔡政論(Zheng-Lun Tsia)

指導教授 ： 徐 澤 志 博士 ； 邵 清 安 博士

元智大學/工程學院/機械工程學系/碩士(2003年)

摘要

本研究是運用光學薄膜之多重反射與透射理論並結合麥克森干涉之實驗光路裝置用來量測磁頭/磁碟之間間隙，其量測方法是藉由物體光束對磁頭/磁碟之間間隙多重反射、透射之反射光量，並與參考光束的反射光量疊合而成干涉光束，其干涉光束在CCD鏡頭上呈現干涉條紋，以CCD連接電腦顯示出干涉條紋圖，再把干涉條紋圖透過影像處理轉換成條紋之頻率，此干涉條紋之頻率作為判別磁頭/磁碟之間間隙依據。
磁頭與磁碟的材質影響此量測方法的準確性，透過薄膜理論模擬不同磁頭與磁碟材質以得到最佳的磁頭與磁碟材質。探討物體光束對碟片的不同入射角度之量測結果，並找出最佳入射角度與臨界角度以及週期性。

關鍵字

多重反射與透射 ； 麥克生干涉量測儀 ； 磁頭/磁碟間隙 ； 物體光束 ； 參考光束 ； 干涉條紋

並列摘要

This paper combine the theory of optical multiple reflection and transmission with the setup of Michelson interferometry to measurement used slider-disk spacing. The method utilized the frequency of fringe to decide the value of slider-disk spacing. However, the fringe patterns which object beam of multiple reflection and transmission to slider-disk spacing and reference beam overlapped. The overlapping beam which formed fringe patterns on camera. Then the fringe patterns transferred to the frequency of fringe via image process.
Material of the slider and disk was influenced accuracy of the method. To find the best material of the slider and disk via the film theory simultaneously. Considered the incident angle of object beam the result of measurement. Then to found the best of the incident angle , critical angle and the cycle of angle.

並列關鍵字

multiple reflection and transmission ； Michelson interferometry ； slider-disk spacing ； object beam ； reference beam ； fringe patterns

參考文獻

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