液晶顯示器在高溫動作下品質評估之研究

The TFT-LCD Quality Evaluation in High Temperature Operation

魏士凱(Shih-Kai Wei)

指導教授 ： 江行全

元智大學/工程學院/工業工程與管理學系/碩士(2012年)

摘要

在可靠度驗證中高溫動作試驗主要是加速產品老化，以了解產品對環境耐受程度或篩選早夭失效產品，因此，在液晶顯示器的產業裡，設計人員通常是藉以觀察產品內電子元件及材料是否受高溫影響而導致產品產生瑕疵或喪失其功能。
本研究主要在探討顯示異常類中的畫面間歇性閃爍品質問題，並運用實驗設計的分析方法來探討液晶顯示模組在高溫動作試驗下有哪些關鍵的操作變數。由實驗的分析結果發現，影響液晶顯示模組在高溫動作試驗下的品質變異主要為溫度、畫面、畫面更新頻率及時間，同時這也是影響液晶顯示模組驅動迴路負載的主要操作條件。驗證本研究的成果發現，可大幅下降顯示異常類不良約73.87%的，在實質效益上將可減少約1萬美金的品質失敗成本及292個維修工時。同時也可回饋給研發設計人員於驅動迴路上未減額設計缺失的改善。

關鍵字

可靠度驗證 ； 實驗設計 ； 液晶顯示器

並列摘要

In “Reliability Verification” high temperature operation test is mainly to accelerate aging to product, so to understand the environmental tolerance or to filter premature mortality of the product. Hence, in the liquid crystal display industry, designers often use this test to observe the impact of high temperature on the electronic components and materials, to see whether it result in defects or loss of function of the product.
This research mainly is to investigate the intermittent flickering problem in display abnormal item, and to use “design of experiment” to analyze key operating variables on high temperature operation test in liquid crystal display module. Adopting a case study of the TFT-LCD testing industry, the main variations are temperature, pattern, frame rate and time. Meanwhile they are also the main operating conditions on the driving circuit load in the liquid crystal display module. Verifying the results of this research, we found display abnormal item dropped about 73.87%, which means in realistic terms a reduction of $10,000 USD of quality failure costs and 292 hours repair time. Also rewards can go to research and development personnel for improvement on the driving circuit.

並列關鍵字

Reliability verification ； design of experimental ； TFT-LCD

參考文獻

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