以線性移位暫存器產生雙測試資料作為測試資料壓縮

Pattern-Coupling-LFSR for Test Data Compression

黃行正(Hsing-Cheng Huang)

指導教授 ： 曾王道

元智大學/資訊學院/資訊工程學系/碩士(2012年)

https://doi.org/10.6838/YZU.2012.00218

摘要

為了要節省測試資料和測試時間，壓縮測試資料是一個常見且有效率的方法。本論文是以線性迴授位移暫存器(Linear Feedback Shift Register，LFSR)為架構，發展出新的雙倍測試樣本產生的方法。此方法主要是將Test cubes經過處理，讓原本只可一組test cube產生一組seed變成讓二組Test cubes產生一組seed，而存於ROM之中的資料量會跟著減少一倍，最後每一組seed再經由LFSR來產生二組測試資料。最後的實驗結果是以ISCAS’89學術電路測試資料進行測試。

關鍵字

無

並列摘要

To reduce the test data volumes, test data compression is a common and efficient method. This thesis is based on LFSR (Linear Feedback Shift Register) as the frame-work to develop a new data compression method to improve the compression ratio. The traditional method used one test cubes to produce one seed. The proposed method used two test cubes to produce one seed. This method can achieve significant compres-sion ratio. Experimental results for the large ISCAS’89 benchmark circuits have dem-onstrated the proposed approach can improve the test data compression ratio.

並列關鍵字

N/A

參考文獻

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