在各種電路最佳化裡電路時間分析扮演相當重要的角色,找出同時滿足功能需求與時間需求的輸入向量稱為時間自動測試向量產生器,一個時間自動測試向量產生器的演算法將會找出在模擬之後同時滿足功能需求與時間需求的輸入向量,先前許多與時間分析的相關研究都使用時間自動測試向量產生器當作解決問題核心的技術,像有串音干擾(crosstalk)、最大瞬間電流,但盡管時間自動測試向量產生器是這麼地有用,但是傳統上的時間自動測試向量產生器速度相當慢並且不能夠處理很大的電路,這我們的論文中,我們提出很有效的方法來建構出時間自動測試向量產生器,我們的所建構出的時間自動測試向量產生器平均來說比之前所提出的研究快了六倍,在某些例子裡我們的效能甚至快了三十二倍。
Circuit timing analysis is important in various aspects of circuit optimization. The problem of finding input vectors achieving functional and temporal requirements is known as timed Automatic Test Pattern Generation (timed ATPG). A timed ATPG algorithm will return an input vector that satisfies functional and temporal requirements simultaneously when evaluated. Several previous works use timed ATPG as a core engine for solving problems related to timing analysis, such as crosstalk and maximum instantaneous current analysis. Despite the usefulness of timed ATPG, traditional timed ATPG is slow and unscalable for large circuits. In this thesis, we present a very effective way for timed ATPG. On average, our results are 6 times faster than the most recent work, and in some cases, up to 32 times faster.