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  • 學位論文

中空陰極式電漿源之研究

Study of a Hollow Cathode Plasma Source

指導教授 : 寇崇善

摘要


碳汙染會影響電子顯微鏡的解析度,為此本論文建立中空陰極式電漿源系統,希望將來能應用於電子顯微鏡的清潔。實驗內容包括以Langmuir Probe觀察電漿特性如電漿密度及電子溫度;觀察氧氣、氫氣、空氣電漿在各種環境下的OES光譜;觀察PVC受Downstream電漿處理的水滴角變化,與Langmuir Probe量測和OES量測做比較。研究結果我們可以低頻、低功率方式點起中空陰極式電漿,並且證實電漿可與碳氫物進行反應。實驗結果顯示在40 mTorr、60 W即可點起電漿,密度可達1011 cm-3,距離電漿源18 cm處密度仍有1010 cm-3。PVC受電漿處理後水滴角下降,在距離電極18 cm處最多可從75°降至11°,在28 cm處最多可降至22°。

關鍵字

中空陰極

並列摘要


無資料

並列關鍵字

hollow cathode plasma

參考文獻


[1] A. Griffiths and T. Walther, "Quantification of carbon contamination under electron beam irradiation in a scanning transmission electron microscope and its suppression by plasma cleaning," Journal of Physics: Conference Series, vol. 241, 2010.
[2] C. M. McGilvery, A. E. Goode, M. S. P. Shaffer, and D. W. McComb, "Contamination of holey/lacey carbon films in STEM," Micron, vol. 43, pp. 450–455, 2012.
[3] S. Horiuchi, T. Hanada, M. Ebisawa, Y. Matsuda, M. Kobayashi, and A. Takahara, "Contamination-free transmission electron microscopy for high-resolution carbon elemental mapping of polymers," ACS Nano, vol. 3, pp. 1297–1304, 2009.
[5] C. G. Morgan, D. Varley, and R. Vane, "Remote Plasma Cleaning from a TEM Sample Holder with an EvactronR De-Contaminator," Microscopy and Microanalysis, vol. 16, pp. 48-49, 2010.
[6] H. Eichhorn, K. H. Schoenbach, and T. Tessnow, "Paschen’s law for a hollow cathode discharge," Applied Physics Letters, vol. 63, p. 3, 1993.

被引用紀錄


楊翊璿(2013)。中空陰極電漿源模態轉換之研究〔碩士論文,國立清華大學〕。華藝線上圖書館。https://doi.org/10.6843/NTHU.2013.00213

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